The XRF technique offers elemental analysis of a wide variety of materials in a highly precise and generally non-destructive way. Particular strengths of this analytical method include easy sample preparation, analysis of non-conducting materials (notably oxides, glasses, ceramics and plastics) and exceptional precision, especially for high concentration levels.

Process control and R&D tasks can be undertaken, and precision inside ± 0.1% relative is routinely achieved whilst limits of detection are often at ppm or sub ppm levels. The XRF technique is also widely used in the metals industry alongside OE spectrometers. This combination brings the optimum configuration for rapid and accurate elemental analysis of both metals and the oxides associated with metal production such as ores and slags.

What X-ray fluorescence  spectrometers ?

XRF spectrometers operate by irradiating a sample with a beam of high energy X-rays and exciting characteristic X-rays from those elements present in the sample (known as X-ray Fluorescence). The individual X-ray wavelengths are sorted via a system of crystals and detectors, and specific intensities are accumulated for each element. When required, chemical concentrations of individual elements are then established by reference to stored calibration data.