Infrared imaging with the Nicolet Continuµm XL microscope reveals sample structure with incredible detail. The microscopes unique design allows for the rapid collection of high-resolution images, while maintaining the features and optical integrity of the original Nicolet Continuµm FT-IR microscope. When coupled with the Nicolet FT-IR series spectrometers, this imaging system provides extended performance, flexibility and ease of use.
The power of infrared microscopy lies in its ability to obtain molecular information on a microscopic scale. The technique is a combination of infrared spectroscopy and optical microscopy. Imaging brings a new dimension to this combination. By collecting massive amounts of spatially resolved spectra, both the identity and distribution of chemical components within a sample can be determined.
Built on a highly configurable platform that can be equipped as a basic point-and-shoot system or upgraded to a fully-featured imaging system, the Nicolet Continuµm XL provides the flexibility and options to expand your applications into the future. It is equipped with two detectors; a single-point detector for point-and-shoot microscopy, and an array detector for imaging.
OMNIC Atlµs 7.0 imaging software integrates spectrometer, microscope and data analysis into a single powerful system. No matter how data is acquired - as a collection of single points, line maps or images - OMNIC Atlµs 7.0 makes the analysis simpler and the results clearer.
Complete sample analysis is possible with a full line of microscope objectives for Nicolet Continuµm microscopes. The utility of Attenuated Total Reflectance (ATR) - one of the most popular sampling techniques in FT-IR today - is extended through a wide selection of crystals for the dedicated ATR Objective.
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